Structural and Morphological Study of PbS:ZnO Nanowires Films Deposited Using Thermal Evaporation Method

We obtained ZnO Nanowires films deposited on two types of substrate (Si (100) and glass) with 12 wt % PbS as dopant by simple thermal evaporation technique. High Resolution Transmission Electron Microscopy (HRTEM) Energy-dispersive X-ray spectroscopy(EDX) images have confirmed the formation (NWs). EDX technique was used to investigate elements content (standard analysis mapping modes). Morphology thickness were investigated from surface cross section via Scanning (SEM) images. The Raman, photoluminescence (PL) Diffraction (XRD) hexagonal phase structure Nanowires, which appeared be very fine their diameters less than 40 nm lengths several micrometers using SEM HRTEM. effect growth well morphology for substrates compared. These could applied in fields. Mapping -EDX has stoichiometry prepared films. Finally, (phase) verified different characterization techniques. optoelectronic application Nanostructures film will study later.